Tester
| Brand | Model
|
Targeted Applications
|
|---|---|---|
Credence |
ASL 1000 |
Diode, Comparator, Converter, Power Management Devices, Current Monitor, Class A/AB Audio AMP, etc. |
Teradyne |
ETS-200T |
FETs, Power FETs, etc. |
Teradyne |
ETS- 300 ; ETS-364 |
Power Management Device, Display Driver, Consumer Audio, Temperature Sensor, ADSL, Disk Driver, Automotive Device, etc. |
Chroma |
3360P |
Power Management Device, LED Driver, Smart Card, Consumer IC, MCU, etc. |
Amida |
AMIDA-1000 ; AMIDA-3000 |
Power Management Devices, Comparator, LED Driver, MOSFET, Motor Driver, MCU, etc. |
Handler
| Brand | Model | Type | High Temp. |
Available Kit |
|---|---|---|---|---|
Hypersonic |
KNIGHTS II ; KNIGHTS IV |
Gravity | NA | SOP/SSOP-150; TSSOP-173; SOP-236; SOP-300 |
Semijess |
JS-400; JP-400; JS-600; JP-600 |
Gravity | NA |
SOP/SSOP-150; SSOP-209; SOP-236; DIP-300 |
Multitest |
8704 |
Gravity | Max. 120℃ |
SOP/SSOP-150; TSSOP-173; SSOP-209; SOP-236; TSSOP-240; SOP-300 |
Chip Right |
CRH400D |
Gravity | NA |
DIP-300 |
Ismeca |
NX16 |
Bowel Feeder | NA |
QFN/DFN 1.6*1.6 / 2*2 / 3*3 / 4*4 / 5*5 / 6*6 / 7*7 ; SOT236 |
SRM |
D248 ; XD16 ; XD208 ; XD248 |
Bowel Feeder | NA |
QFN/DFN 1.6*1.6 / 2*2 / 2*3 / 3*3 / 3*4 / 3.5*3.5 / 3.5*4.5 / 4*4 / 5*5 / 5*6 / 5.2*6.2 / 6*6 / 7*7 |
Chip Right |
CRH3400 |
Pick & Place | Max. 130℃ |
QFN 3*3 / 4*4 / 5*5 / 7*7; LQFP 9*9 / 10*10 / 14*14/ |
Prober
| Brand | Model | Wafer Size | Wafer Thickness | High Temp. | Low Temp. |
|---|---|---|---|---|---|
| TSK | UF200 ; UF200A | 4" , 5" , 6" , 8" | >= 6 mil | Max. 150℃ | Min. -40℃ |
Laser Trimmer
| Brand | Model | Wafer Site | Wafer Thickness |
|---|---|---|---|
| ESI | ESI9300 ; ESI9350 | 6" , 8" | >= 8 mil |
Automated Defect Inspection System
| Brand | Model | Wafer Size | Wafer Thickness | Min. Defect Size |
|---|---|---|---|---|
| RUDOLPH | AUGUST NSX-90 | 6" , 8" | >= 8 mil | 5um |